By F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill (auth.), Gavin R. Mallett, Marie J. Fay, William M. Mueller (eds.)
The papers awarded during this quantity of Advances in X-Ray research have been selected from these offered on the Fourteenth Annual convention at the functions of X-Ray research. This convention, subsidized via the Metallurgy department of the Denver learn Institute, collage of Denver, was once hung on August 24,25, and 26, 1965, on the Albany inn in Denver, Colorado. Of the fifty six papers awarded on the convention, forty six are integrated during this quantity; additionally integrated is an open dialogue hung on the consequences of chemical com bination on X-ray spectra. the topics awarded symbolize a large scope of functions of X-rays to various fields and disciplines. those integrated such fields as electron-probe microanalysis, the impression of chemical mix on X-ray spectra, and the makes use of of soppy and ultrasoft X-rays in emission research. additionally incorporated have been classes on X-ray diffraction and fluor escence research. there have been a number of papers on exact themes, together with X-ray topography and X-ray absorption fine-structure research. William L. Baun contributed massive attempt towards the convention by means of organizing the consultation at the influence of chemical blend on X-ray spectra tremendous constitution. a different consultation used to be demonstrated during the first-class efforts of S. P. Ong at the makes use of and applica tions of soppy X-rays in fluorescent research. we provide our honest due to those males, for those designated classes contributed enormously to the good fortune of the conference.
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Extra resources for Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965
R. Lang, "The Projection Topograph: A New Method in X-Ray Diffraction Microradiography," Acta Cryst. 12: 249-250, 1959. LATTICE DEFECT RESEARCH BY KOSSEL TECHNIQUE AND DEFORMATION ANALYSIS Masataka Umeno, Hideaki Kawabe, and Gunji Shinoda Osaka University Miyakojima, Osaka, Japan ABSTRACT An electron probe microanalyzer (EPMA) was applied for the deformation analysis of aluminum single crystals. The lattice distortions caused by tensile stresses were observed by Kossel patterns, which are sensitive in their change of shape to lattice distortion.
Defects in the crystal. The imperfection is detected by placing a photographic plate near the primary beam entrance surface (reflection geometry); the transmitted beam exit surface is utilized in the transmission arrangement. The perturbed lattice diffracts with more intensity than the unperturbed material enclosing the discontinuity. ). These techniques demand long exposure times (10-60 hr) and introduce the problem of separating substrate and film defects since the defect array in the substrate and the film are superimposed in the transmission topograph.
In diameter, and moreover, transmission Kossel patterns can be easily obtained without experimental difficulties. Since the appearance of EPMA some reports have been published concerning new methods of precise measurement of lattice constants from Kossel patterns and their applications to the metallurgical field. 8- 10 It was well known that Kossel patterns are very sensitive to the lattice distortions of specimen crystals. Many years ago one of the present authors investigated lattice defects in synthetic rubies, cold-worked macrocrystals of aluminum, and (X-brass with 1 References are at the end of the paper.
Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965 by F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill (auth.), Gavin R. Mallett, Marie J. Fay, William M. Mueller (eds.)